v4.0.0-pre.1

Updates from v4.0.0-pre:
Fixed IVCurve bug --> removing unused channels from PowerGroups object.
Fixed copying bug that prevented some IVCurve files from being copied to the proper directory.
Removed duplicate json file block in siteConfig.

v4.0.0-pre

What's changed:

• Improved multi-module coldbox operations
• Now runs all tests for open bump bonds in a single test.
• Updated to use newly tagged inner-tracker-tests repo
• New way of storing fc7 ipaddresses to avoid overwriting site-specific settings --> Need to modify your instrument json files!

Supported software (included in docker image):

• Felis: v1.1.8
• Ph2ACF: v6-20
• InnerTrackerTests: v1.0.1
• ICICLE: 2.1.0

To update:

• From the Ph2_ACF_GUI directory run git checkout v4.0.0-pre
• Update your instrument json files to add the FC7 ipaddresses. You can copy one of the provided json files to use as a template to create a new one that contains your site-specific settings (USB ports, devices, FC7 ipaddresses, etc). You should give this a unique name (maybe change "osu" to your institution name).
• Update siteConfig.py to specify your cooling option and the instruments json file to use.
• The new docker image should automatically pull from dockerhub when you open the GUI with bash run_Docker.sh
• That should be all you need to do. Please report any potential bugs, issues, etc via git issues

Known issues:

• OpenBumpTest is a composite test of three subtests. Currently the progress bar cycles from 0 to 100% for each test (three times). A patch for this will be available soon, but this is purely an asthetic issue and has no affect on the test results.
• The "sanity" ranges for the TrimbitScan tests are a bit too tight in Felis. When a stable. update is available in Felis we can update to fix this issue. This is also purely asthetic.
• A window may pop up asking if you want to "Continue", "Exit", or "Retry" after an IVCurve is run. This is not intended to pop up, so just click "Continue" to move on to the next test. This doesn't affect the results, but will be fixed soon.

v3.1.1

What's Changed:

• Automated control of 8-module coldbox and HVbox.
• Added notifications during 8-module coldbox operations
• Updated to new Felis version to include Panthera upload support for all available tests.
• Added IREF code check support for CROCv2 while maintaining compatibility with CROCv1

Upgrade Instructions:

• Make sure you have your own json file for your instruments. The ones with "osu" in the name are used as defaults for you to copy and make your own, and therefore they may get overwritten when updating.
• Update local files: with git fetch followed by git checkout v3.1.1 and finally git pull
• For more details on how the 8-module coldbox automation works or instructions on how to use it, please consult the wiki entry here.

v2.4.2

In order to update, simply do
git fetch
git checkout v2.4.2

Summary of updates:

• Can add comments when uploading results to Panthera database
• Fixed bug such that crosstalk tests always use the correct injection parameters.
• Updated format of data output directories to allow for running and saving tests with multiple fc7s in parallel.
• Added quick SLDO test (SLDOScan_Fast)
• Updated to Ph2ACF v6-17 --> Now checks wirebonded IREF values with database
• Updated to lastest branch of Felis

v2.4.1-prerelease

Prerelease for v2.4.1.

New tests:

• SLDOScan now runs using the probe card and GADC simultaneously. Readings are done with only the probe card until the supplied current hits a specified target for beginning reading from the GADC. At this point readings from the probe card and GADC are taken simultaneously during each step for the LV current sweep. The output ROOT files have been updated to store two separate TCanvases, one for each measurement type. Note: This test requires a probe card and an ADC board.
• SLDOScan_GADC: This test runs only the GADC portion of the previous test.
• TrimbitScan: This test sweeps the VDD* values for each chip while reading the corresponding pins from the probe card. The sweep for each chip stops once a voltage of 1.29V is read from that particular pin. Note: This test requires a probe card and an ADC board.
• TrimbitScan_GADC: This test does the same thing as the TrimbitScan test, except it reads from the GADC instead of the probe card.
• LaneTesting: This test automatically switches between running a pixelalive test with one of two configurations. For quad modules it runs with the M2M2 data ane merging configuration. For dual modules it reads the extra data lane from chip 12 (SingleLaneTest).
• CommunicationTest: This test checks that the chip communication works and also compares the wirebonded Iref bits to what is stored in the Purdue DB.
• IREF_GADC: This test reads the IREF register from the chip and stores this data in a DQM root file.

Other features:

• Added new common sequences
• Allows abort during IVCurve scans
• Updated Ph2ACF to v6-15
• Updated felis to v1.1.4
• Updated timers for each test to give more accurate runtimes by including time needed for chip initialization and HV ramping in the runtime calculation.

v2.3.1

details coming soon

v2.2.2

• Can upload custom chip configuration txt file from Panthera -> can be used to bypass chip threshold tuning
• SLDO_GADC scan -> beta version of an SLDO scan that uses the GADC instead fo the probe cards (needed for post-parylene tests)
• Updated Assembly test sequence to include bump bond test using xtalk method.
• Updated Full Performance test to include IV curve from 0 to -350V -> for use at testing centers only.
• SLDO scan uploads have ROC number replaced with Chip ID -> needed for Panthera to show plots correctly in web interface
• Now stores versions of included software (felis, Ph2_ACF, icicle) as well as GUI version for metadata upload to Panthera.
• Increased data points for SLDO scans.
• Fixed bug with Arduino activation
• Removed cap-sensitivity of module ID entry.

v2.2.1

Patch to v2.2.0 to include updated test sequences.

v2.2.0

Added features:
Can upload custom chip configuration txt file from Panthera -> can be used to bypass chip threshold tuning
SLDO_GADC scan -> beta version of an SLDO scan that uses the GADC instead fo the probe cards (needed for post-parylene tests)
Updated Assembly test sequence to include bump bond test using xtalk method.
Updated Full Performance test to include IV curve from 0 to -350V -> for use at testing centers only.
SLDO scan uploads have ROC number replaced with Chip ID -> needed for Panthera to show plots correctly in web interface
Now stores versions of included software (felis, Ph2_ACF, icicle) as well as GUI version for metadata upload to Panthera.

v2.1.0: Merge pull request #468 from OSU-CMS/updateimagename

Adds protections against software version mismatching
Fixes bug with test indexing.
Now works with TFPX Quads and Duals with HDIv2
Updated pin mapping for SLDO scans using ADC card

Will add more details shortly.