tests/esp: Add support for string test IDs

Author: gerekon

testing/esp/debug_backend_tests.py

@@ -240,7 +240,11 @@ def __init__(self, bin_dir='', build_dir='', src_dir='', app_name='',
         # App binary offeset in flash
         self.pt_off = ESP32_PT_FLASH_OFF
         # name of test app variable which selects sub-test to run
+        # used for number-based tests selection
         self.test_select_var = None
+        # name of test app variable which holds sub-test string ID (name) to run
+        # used for string-based tests selection
+        self.test_id_var = None
         # Program's entry point ("app_main" is IDF's default)
         self.entry_point = entry_point
         # File containing commands to execute at startup
@@ -500,6 +504,7 @@ def setUp(self):
         self.stop_exec()
         self.prepare_app_for_debugging(self.test_app_cfg.app_off)
         # ready to select and start test (should be done in test method)
+        self.select_sub_test(self.id())
 
     def tearDown(self):
         self.clear_bps()
@@ -544,10 +549,14 @@ def clear_wps(self):
             self.gdb.delete_bp(wpn)
         self.wps = {}
 
-    def select_sub_test(self, sub_test_num):
+    def select_sub_test(self, sub_test_id):
         """ Selects sub test in app running on target
         """
-        self.gdb.data_eval_expr('%s=%d' % (self.test_app_cfg.test_select_var, sub_test_num))
+        if type(sub_test_id) is str:
+            self.gdb.data_eval_expr('%s=%d' % (self.test_app_cfg.test_select_var, -1))
+            self.gdb.data_eval_expr('%s=\\"%s\\"' % (self.test_app_cfg.test_id_var, sub_test_id))
+        else:
+            self.gdb.data_eval_expr('%s=%d' % (self.test_app_cfg.test_select_var, sub_test_id))
 
 
     def run_to_bp(self, exp_rsn, func_name, tmo=20):
@@ -627,6 +636,7 @@ def __init__(self, methodName):
         self.test_app_cfg.bld_path = os.path.join('bootloader', 'bootloader.bin')
         self.test_app_cfg.pt_path = os.path.join('partition_table', 'partition-table.bin')
         self.test_app_cfg.test_select_var = 's_run_test'
+        self.test_app_cfg.test_id_var = 's_run_test_str'
 
 
 class DebuggerGenericTestAppTestsDual(DebuggerGenericTestAppTests):

testing/esp/test_apps/gen_ut_app/main/gen_ut_app.c

@@ -8,6 +8,7 @@
 */
 #include <stdio.h>
 #include <string.h>
+#include <fnmatch.h>
 #include "freertos/FreeRTOS.h"
 #include "freertos/task.h"
 #include "gen_ut_app.h"
@@ -25,6 +26,7 @@ const static char *TAG = "ut_app";
 
 // test app algorithm selector
 volatile static int s_run_test = CONFIG_GEN_UT_APP_RUNTEST;
+volatile static char s_run_test_str[256];
 // vars for WP tests
 volatile static int s_count1 = 0;
 volatile static int s_count2 = 100;
@@ -346,10 +348,23 @@ static void step_over_inst_changing_intlevel(void* arg)
 }
 #endif
 
+// match test string ID with pattern. See fnmatch for wildcard format description.
+bool test_id_match(const char *pattern, const char *id)
+{
+    if (esp_ptr_internal(id) && esp_ptr_byte_accessible(id)) {
+        return fnmatch(pattern, id, 0) == 0;
+    }
+    return false;
+}
 
 void app_main()
 {
-    ESP_LOGI(TAG, "Run test %d\n", s_run_test);
+    if (s_run_test == -1) {
+        ESP_LOGI(TAG, "Run test '%s'\n", s_run_test_str);
+        s_run_test = (int)s_run_test_str;
+    } else {
+        ESP_LOGI(TAG, "Run test %d\n", s_run_test);
+    }
     if (s_run_test == 100){
         static struct timer_task_arg task_arg = { .tim_grp = TEST_TIMER_GROUP_1, .tim_id = TEST_TIMER_0, .tim_period = 500000UL, .isr_func = test_timer_isr};
         xTaskCreate(&blink_task, "blink_task", 4096, &task_arg, 5, NULL);
@@ -386,12 +401,22 @@ void app_main()
                 break;
             }
         }
-        if (res == UT_UNSUPPORTED) {
-            ESP_LOGE(TAG, "Invalid test id (%d)!", s_run_test);
-        } else if (res != UT_OK) {
-            ESP_LOGE(TAG, "Test %d failed (%d)!", s_run_test, res);
+        if (s_run_test != -1) {
+            if (res == UT_UNSUPPORTED) {
+                ESP_LOGE(TAG, "Invalid test id (%d)!", s_run_test);
+            } else if (res != UT_OK) {
+                ESP_LOGE(TAG, "Test %d failed (%d)!", s_run_test, res);
+            } else {
+                ESP_LOGI(TAG, "Test %d completed!", s_run_test);
+            }
         } else {
-            ESP_LOGI(TAG, "Test %d completed!", s_run_test);
+            if (res == UT_UNSUPPORTED) {
+                ESP_LOGE(TAG, "Invalid test id (%s)!", s_run_test_str);
+            } else if (res != UT_OK) {
+                ESP_LOGE(TAG, "Test '%s' failed (%d)!", s_run_test_str, res);
+            } else {
+                ESP_LOGI(TAG, "Test '%s' completed!", s_run_test_str);
+            }
         }
         // wait forever
         ulTaskNotifyTake(pdFALSE, portMAX_DELAY);

testing/esp/test_apps/gen_ut_app/main/gen_ut_app.h

@@ -21,6 +21,7 @@
 #ifndef GEN_UT_APP_H
 #define GEN_UT_APP_H
 
+#include <stdbool.h>
 #include "ut_idf_ver.h"
 #include "sdkconfig.h"
 
@@ -56,6 +57,15 @@ typedef ut_result_t (*test_func_t)(int test_num);
 */
 #define BLINK_GPIO CONFIG_BLINK_GPIO
 
+#define TEST_ID_PATTERN(_name_)     _name_##_id_pattern
+#define TEST_ID_MATCH(_exp_, _id_)  test_id_match(_exp_, (const char *)_id_)
+#define TEST_ENTRY(_name_)    _name_##_task
+#define TEST_DECL(_name_, _exp_) \
+static const char _name_##_id_pattern[] = _exp_; \
+static void _name_##_task(void *pvParameter)
+
+bool test_id_match(const char *exp, const char *id);
+
 #endif
 
 #endif //GEN_UT_APP_H

testing/esp/test_apps/gen_ut_app/main/special_tests.c

@@ -253,6 +253,8 @@ ut_result_t special_test_do(int test_num)
             break;
         }
 #if CONFIG_IDF_TARGET_ARCH_RISCV
+        /* we have two different tests for Xtensa and RISCV with the same ID. See above.
+           TODO: switch to string test IDs like 'test_bp.DebuggerBreakpointTestsDual.test_bp_add_remove_run', 'test_bp.DebuggerBreakpointTests*.test_bp_add_remove_run' */
         case 804:
         {
             xTaskCreatePinnedToCore(&target_wp_reconf_task, "target_wp_reconf_task", 2048, NULL, 5, NULL, portNUM_PROCESSORS-1);